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    • Adapter-enhanced two-stage continual defect detection

    • Vol. 30, Issue 8, Pages: 2675-2689(2025)   

      Received:11 November 2024

      Revised:2025-01-23

      Published:16 August 2025

    • DOI: 10.11834/jig.240663     

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  • Feng Jun, Meng Xujing, Shang Yuquan, Niu Chaofan. 2025. Adapter-enhanced two-stage continual defect detection. Journal of Image and Graphics, 30(8):2675-2689 DOI: 10.11834/jig.240663.
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相关作者

Meng Xujing 石家庄铁道大学信息科学与技术学院;石家庄市人工智能重点实验室
Shang Yuquan 石家庄铁道大学信息科学与技术学院;石家庄市人工智能重点实验室
Niu Chaofan 河北圣昊光电科技有限公司
Sang Nong 华中科技大学人工智能与自动化学院
Huang Kaiqi 中国科学院自动化研究所
Zhao Yao 北京交通大学计算机 科学与技术学院
Gao Changxin 华中科技大学人工智能与自动化学院
Kao Yueying 北京市科学技术研究院信息与人工智能技术研究所

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Hebei Thahoo Photoelectric Technology Co,Ltd.
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