In order to increase measurement precision in Profilometry

reduce possible frequency overlaps and tolerate the height discontinuity of complex three-dimensional shape

an improved Profilometry using a grid carrier fringe pattern is presented. In the Profilometry

two spatial fringe patterns are perpendicular to each other to avoid frequency overlaps; two one-dimensional deformed grating patterns are separated from the deformed grid pattern by use of both two-dimensional Gabor transform and variable rectangle bandpass filters

from which the wrapped phases in x and y directions are respectively extracted. The corresponding unwrapped phases are achieved by use of a lookup table method. Compared with Profilometry using single frequency fringe pattern and one-dimensional double-frequency fringe pattern

the improved Profilometry could obtain double phase information of identical precision

increase measurement precision and realize discontinuous phase unwrapping. Detailed theoretical analysis is presented

and the simulated and experimental results show that it is feasible.