Variety of detected features and complexity of similarity calculation are two main problems in image registration. In this paper

angle histogram and alignment metric of edge feature points are defined

and a new approach for image registration is presented based on alignment metric of edge feature points. The first step is to detected edge image and feature points by using wavelet multi-scale product. In this step

wavelet multi-scale product can ensure the accuracy of edge image and feature points. The second step is to calculate alignment metric of feature points based on rotating angle obtained from angle histogram. Then mapping points can be accurately determined by an appropriate threshold. The calculation complexity of alignment metric is greatly simplified since the process is based on edge images. Several experiments conducted illustrate that this method have a good performance of robust

accuracy and efficiency

and also it can be applied to many situations.